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001 ocn824699045
003 OCoLC
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006 m o d
007 cr cnu---unuuu
008 130121s2000 si a ob 101 0 eng d
020 9789812792136|q(electronic book)
020 9812792139|q(electronic book)
020 |z9810244525
020 |z9789810244521
035 (OCoLC)824699045
040 N$T|beng|epn|cN$T|dOCLCO|dE7B|dI9W|dOCLCF|dOCLCO|dYDXCP
|dOCL|dOCLCO|dEBLCP|dOCLCQ|dOCLCO|dOCLCQ
049 RIDW
050 4 QD181.S6|bI58 1999eb
072 7 SCI|x013030|2bisacsh
082 04 546/.6832|222
084 UP 3100|2rvk
090 QD181.S6|bI58 1999eb
111 2 International School of Solid State Physics|0https://
id.loc.gov/authorities/names/no2001061002|n(16th :|d1999 :
|cErice, Italy)
245 10 Silicides :|bfundamentals and applications : proceedings
of the 16th Course of the International School of Solid
State Physics, Erice, Italy, 5-16 June 1999 /|ceditors,
Leo Miglio & Francois d'Heurle.
246 18 Silicides, fundamentals and applications
246 30 16th Course of the International School of Solid State
Physics
264 1 Singapore ;|aRiver Edge, NJ :|bWorld Scientific,|c[2000]
264 4 |c©2000
300 1 online resource (viii, 377 pages) :|billustrations.
336 text|btxt|2rdacontent
337 computer|bc|2rdamedia
338 online resource|bcr|2rdacarrier
340 |gpolychrome|2rdacc
347 text file|2rdaft
490 1 The science and culture series. Materials science ;|v1
504 Includes bibliographical references and index.
505 0 Crystal chemistry of metal silicides / R. Madar --
Structural features of binary transition metal silicides /
I. Engstrom -- Bonding and polymorphism in transition
metal disilicides / L. Miglio, M. Iannuzzi and D. Migas --
Diffusion in silicides: basic approach and practical
applications / P. Gas and F.M. d'Heurle -- Silicides and
thermodynamics / C. Bernard and A. Pisch -- Optical
properties of silicides: theory and experiment / V.
Antonov and F. Marabelli -- Electronic structure [symbol]
/ K. Goransson -- Ion beam synthesized [symbol]
precipitates in Si: structural characterization and origin
of the 1.54 pm luminescence / M.G. Grimaldi, S. Coffa and
C. Spinella -- Optical characterization of [symbol] / W.
Henrion [and others] -- Fundamental electronic properties
of semiconducting silicides / V. Borisenko --
Semiconducting silicides -- thermoelectric properties and
applications / A. Heinrich -- Metallic silicides / G.
Ottaviani -- Conversion electron Mossbauer spectroscopy
study of iron disilicide / M. Fanciulli -- The kinetics of
reactive phase formation: silicides / F.M. d'Heurle --
Reactive phase formation in binary and ternary silicide
systems / A.A. Kodentsov [and others] -- Epitaxial
silicides / H. von Kanel -- Ion bean synthesis, molecular
beam allotaxy and self-assembled patterning of epitaxial
silicides / S. Mantl -- Silicides: materials science and
applications for microelectronics / K. Maex and A. Lauwers
-- Mechanisms for enhanced formation of the C54 phase of
titanium silicides / J.M.E. Harper [and others] --
Titanium and tungsten silicides in silicon device
technology / G. Queirolo -- Micro-Raman spectroscopy
applied to microelectronics: the phase transition of
[symbol] from C49 to C54 / S. Quilici -- Stresses in
silicides thin films obtained by solid state reaction / P.
Gergaud [and others] -- The changing views on the Schottky
barrier / R. Tung -- Internal photoemission spectroscopy
for a [symbol] Schottky junction / B. Asian and R. Turan -
- Metal rich structural silicides / A.J. Thorn [and
others] -- The epitaxy of [symbol] on Si substrates: a
review / S.-L. Zhang and F.M. d'Heurle -- Agglomeration of
cobalt disilicide on silicon / A. Alberti, L. Kappius and
F.M. d'Heurle.
520 Silicides were introduced into the technology of
electronic devices some thirty years ago; since then, they
have been continuously used to form both ohmic and
rectifying contacts to silicon. Silicides are also
important for other applications (thermoelectric devices
and structural applications, such as jet engines), but it
is not easy to find an updated reference containing both
their basic properties, either chemical or physical, and
the latest applications. The 16th Course of the
International School of Solid State Physics, held in Erice
(Italy) in the late spring of 1999, was intended to break
artificial barriers between disciplines, and to gather
people concerned with the properties and applications of
silicides, regardless of the formal fields to which they
belong, or of the practical goals they pursue. This book
is therefore concerned with theory as well as applications,
metallurgy as well as physics, and materials science as
well as microelectronics.
588 0 Print version record.
590 eBooks on EBSCOhost|bEBSCO eBook Subscription Academic
Collection - North America
650 0 Silicides|0https://id.loc.gov/authorities/subjects/
sh85122509|vCongresses.|0https://id.loc.gov/authorities/
subjects/sh99001533
650 0 Electronics|xMaterials|vCongresses.|0https://id.loc.gov/
authorities/subjects/sh2008102950
650 0 Integrated circuits|vCongresses.|0https://id.loc.gov/
authorities/subjects/sh2008104261
650 0 Thin films|vCongresses.|0https://id.loc.gov/authorities/
subjects/sh2008112885
650 7 Silicides.|2fast|0https://id.worldcat.org/fast/1118627
650 7 Electronics|xMaterials.|2fast|0https://id.worldcat.org/
fast/907562
650 7 Integrated circuits.|2fast|0https://id.worldcat.org/fast/
975535
650 7 Thin films.|2fast|0https://id.worldcat.org/fast/1150018
655 4 Electronic books.
655 7 Conference papers and proceedings.|2fast|0https://
id.worldcat.org/fast/1423772
655 7 Erice (1999)|2swd
655 7 Conference papers and proceedings.|2lcgft|0https://
id.loc.gov/authorities/genreForms/gf2014026068
700 1 Miglio, L.|0https://id.loc.gov/authorities/names/n93062668
700 1 D'Heurle, F. M.|0https://id.loc.gov/authorities/names/
no2001061004
776 08 |iPrint version:|aInternational School of Solid State
Physics (16th : 1999 : Erice, Italy).|tSilicides.
|dSingapore ; River Edge, NJ : World Scientific, ©2000
|z9810244525|w(DLC) 2001280362|w(OCoLC)48642830
830 0 Science and culture series (Singapore).|pMaterials science
;|0https://id.loc.gov/authorities/names/no2001041558|v1.
856 40 |uhttps://rider.idm.oclc.org/login?url=http://
search.ebscohost.com/login.aspx?direct=true&scope=site&
db=nlebk&AN=514223|zOnline eBook. Access restricted to
current Rider University students, faculty, and staff.
856 42 |3Instructions for reading/downloading this eBook|uhttp://
guides.rider.edu/ebooks/ebsco
901 MARCIVE 20231220
948 |d20160607|cEBSCO|tebscoebooksacademic|lridw
994 92|bRID
