Title Frontiers in electronics : future chips : proceedings of the 2002 Workshop on Frontiers in Electronics (WOFE-02), St Croix, Virgin Islands, USA, 6-11 January 2002 / editors, Yoon Soo Park, Michael S. Shur, William Tang.

Publication Info.	River Edge, N.J. : World Scientific, [2002]
	©2002

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Description	1 online resource (xii, 386 pages) : illustrations (some color).
Physical Medium	polychrome
Description	text file
Series	Selected topics in electronics and systems ; v. 26
	Selected topics in electronics and systems ; v. 26.
Note	Accompanied by 1 booklet of errata: Special issue: Frontiers in electronics: future chips. 333-345 p. : ill. ; 25 cm.
Bibliography	Includes bibliographical references.
Contents	Preface; CONTENTS; Plenary Talk; Optical Wave Propagation in Periodic Structures; MEMS Technology for Advanced Telecommunication Applications; Low Temperature Physics at Room Temperature in Water: Charge Inversion in Chemical and Biological Systems; Ultra Large Scale Electronics (ULSI); Mosfet and Front-End Process Integration: Scaling Trends Challenges and Potential Solutions Through the End of the Roadmap; Issues Achievements and Challenges Towards Integration of High-k Dielectrics; Materials for Strained Silicon Devices; Recent Progress of Ferroelectric Memories; System-on-Chip Integration.
	Ultra-Thin SOI Transistors for Ultimate CMOS Technology: Fundamental Properties and Application PerspectivesFar-Future Trends in SOI Technology: A Guess; Nanoelectronics; Nanoelectronics: Some Current Aspects and Prospects; Electrotextiles; Electrotextiles; Semiconductor Thin Films and Thin Films Devices for Electrotextiles; Electrotextiles: Concepts and Challenges; Wide Band Gap Materials and Devices; Strain Energy Band Engineering Approach to AIN/GaN/InN Heterojunction Devices; Semiconductor UV Sources and Detectors: Some Non-Consumer Applications.
	Optimization of White All-Semiconductor Lamp for Solid-State Lighting ApplicationsSystem Impact of Silicon Carbide Power Devices; Low Frequency Noise in Gallium Nitride Field Effect Transistors; Hot-Phonon Limited Electron Energy Relaxation in AIN/GaN; Terahertz Electronics and Applications; Polar-Optical Phonon Enhancement of Harmonic Generation in Schottky Diodes; Environmental Sensing of Chemical and Biological Warfare Agents in the THz Region; THz Detection by Resonant 2-D Plasmons in Field Effect Devices; Advanced Concepts; Thermal Management in Optoelectronics.
	The Multiple-Gate MOS-JFET TransistorArchitecture and Design of an 8-Bit FLUX-1 Superconductor RSFQ Microprocessor; Sensing Applications; Noise Measurement of III-V Compound Detectors for 2 um Lidar/DIAL Remote Sensing Applications; Spectral Response Measurements of Short Wave Infrared Detectors (SWIR); Modeling and Simulation; Numerical Analysis of Random Dopant-Induced Effects in Semiconductor Devices; A Simulation-Based Preview of Extremely Scaled Double-Gate CMOS Devices and Circuits; Full-Chip Power-Supply Noise: The Effect of On-Chip Power-Rail Inductance.
Summary	The 2002 Workshop on Frontiers in Electronics was the third in the series of WOFE workshops. Over 70 leading experts from academia, industry, and government agencies reported on the most recent developments in their fields and exchanged views on future trends and directions of the electronics and photonics industry. The issues they addressed ranged from system-on-chip to DNA doping, from ultrathin SOI to electrotextiles, from photonics integration on the ULSI platform to wide band gap semiconductor devices and solid state lighting. The rapid pace of electronic technology evolution compels a me.
Local Note	eBooks on EBSCOhost EBSCO eBook Subscription Academic Collection - North America
Subject	Electronics -- Congresses.
	Electronics -- Congresses.
Genre/Form	Electronic books.
	Conference papers and proceedings.
	Conference papers and proceedings.
Added Author	Park, Yoon-Soo.
	Shur, Michael.
	Tang, William.
Other Form:	Print version: Workshop on Frontiers in Electronics (2002 : Saint Croix, V.I.). Frontiers in electronics. River Edge, N.J. : World Scientific, ©2002 9812382224 9789812382221 (DLC) 2003278215 (OCoLC)52392586
ISBN	9789812796912 (electronic book)
	9812796916 (electronic book)
	9812382224

Title Frontiers in electronics : future chips : proceedings of the 2002 Workshop on Frontiers in Electronics (WOFE-02), St Croix, Virgin Islands, USA, 6-11 January 2002 / editors, Yoon Soo Park, Michael S. Shur, William Tang.

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