| Description |
1 online resource (xvi, 410 pages) : illustrations. |
| Physical Medium |
polychrome |
| Description |
text file |
| Series |
World Scientific series on synchrotron radiation techniques and applications ; vol. 2
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World Scientific series on synchrotron radiation techniques and applications ; vol. 2.
|
| Bibliography |
Includes bibliographical references and index. |
| Contents |
Ch. 1. Introduction / Yasuhiro Iwasawa -- Ch. 2. Theory and Parameters of EXAFS / Toshihiko Yokoyama -- Ch. 3. Analysis of EXAFS / Kiyotaka Asakura -- Ch. 4. Theory and Analysis of XANES. 4.1. MO Approach / Nobuhiro Kosugi. 4.2. Multiple Scattering Approach / Takashi Fujikawa -- Ch. 5. Measurement of XAFS. 5.1. Instrumentation / Masaharu Nomura. 5.2. In Situ XAFS Measurement of Catalysts / Dominique Bazin, Herve Dexpert and John Lynch -- Ch. 6. Laboratory XAFS / Yasuo Udagawa -- Ch. 7. Applications of EXAFS to Catalyst Characterization. 7.1. Supported Bimetallic Cluster Catalysts / Grayson H. Via and John H. Sinfelt. 7.2. Metal Clusters and Particles in Zeolites / Z. Conrad Zhang, Guan-Dao Lei and Wolfgang M.H. Sachtler. 7.3. Metal Oxide Catalysts / Kiyotaka Asakura and Yasuhiro Iwasawa. 7.4. Supported Multimetal Sites / Kiyotaka Asakura and Yasuhiro Iwasawa. 7.5. Sulfide Catalysts / Bjerne S. Clausen and Henrik Topsoe. |
| Summary |
X-ray absorption fine structure (XAFS) is a powerful technique in characterization of structures and electronic states of materials in many research fields including, e.g., catalysts, semiconductors, optical ingredients, magnetic materials, and surfaces. This characterization technique could be applied in a static or a dynamic state (in-situ condition). The XAFS can provide information that is not accessible by other techniques for characterization of materials, particularly catalysts and related surfaces. Furthermore, XAFS can provide a molecular-level approach to the study of reaction mechanisms for the understanding of catalysts and development of new catalysts. A number of synchrotron radiation facilities have been planned to be built in Asian countries in addition to the high-brilliant synchrotron radiation facilities under construction in the USA, Europe, and Japan. The applications of XAFS have now expanded to catalytic chemistry and engineering, surface science, organometallic chemistry, materials science, solid-state chemistry, geophysics, etc. This book caters to a wide range of researchers and students working in the domain or related topics. |
| Local Note |
eBooks on EBSCOhost EBSCO eBook Subscription Academic Collection - North America |
| Subject |
Extended X-ray absorption fine structure.
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Extended X-ray absorption fine structure. |
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Catalysts.
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Catalysts. |
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Surfaces (Technology)
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Surfaces (Technology) |
| Genre/Form |
Electronic books.
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| Added Author |
Iwasawa, Yasuhiro, 1946-
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| Other Form: |
Print version: X-ray absorption fine structure for catalysts and surfaces. Singapore ; River Edge, N.J. : World Scientific, ©1996 9810223234 (DLC) 96000952 (OCoLC)34150952 |
| ISBN |
9789812830838 (electronic book) |
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9812830839 (electronic book) |
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9810223234 |
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9789810223236 |
|
