Rotterdam, The Netherlannds : Sense Publishers, [2017]
Rating:
Lomonosov Conference on Elementary Particle Physics (13th : 2007 : Moscow, Russia)
Singapore ; Hackensack, N.J. : World Scientific Pub. Co., [2009]
Rating:
Chicago ; London : University of Chicago Press, [2015]
Rating:
Tushnet, Mark, 1945-
[Place of publication not identified] : New York University Press, 2017.
Rating:
Barlet, Olivier.
London ; New York : Zed Books, [2000]
Rating:
New Delhi ; Thousand Oaks, Calif. : Sage Publications, 2005.
Rating:
New Delhi ; Thousand Oaks, Calif. : Sage Publications, 2005.
Rating:
Manchester : Manchester University Press, 2014.
Rating:
London : KoganPage, 2015.
Rating:
Straubhaar, Joseph D.
Boston, MA : Wadsworth Cengage Learning, 2013.
Enhanced 7th ed.
Rating:
International Conference on the Registration, Evaluation and Authorisation of Chemicals and Its Impact on US Trade (9th : 2011 April 13-14 : Atlanta, Ga.), issuing body.
Shrewsbury [England] : Smithers Rapra Technology Ltd., [2011]
Rating:
Budapest ; New York : Central European University Press, 2015.
Rating:
Materson, Lisa G.
Chapel Hill : University of North Carolina Press, [2009]
Rating:
London : Bloomsbury Publishing, 2012.
Rating:
Budapest ; New York, NY : Central European University Press, 2018.
Rating:
Kennedy, Donald, 1931-2020.
Cambridge, Mass. : Harvard University Press, 1997.
Rating:
Suenens, Kristien, 1981- author.
Leuven : Leuven UP [2020]
Rating:
Niven, Bill, 1956- author.
New Haven : Yale University Press, [2018]
Rating:
Noble, Denise, author.
London : Palgrave Macmillan, [2016]
Rating:
Hague, Netherlands : Eleven International Publishing, 2015.
Rating:
Bhote, Keki R., 1925-2013.
New York : AMACOM, 2003.
Rating:
Materson, Lisa G.
Chapel Hill : University of North Carolina Press, [2009]
Rating:
Bristol, UK ; Chicago : Intellect, 2013.
Rating:
Stephens, Bret.
New York : Sentinel, 2014.
Rating:
International Wittgenstein Symposium (35th : 2012 : Kirchberg am Wechsel, Austria)
Berlin : De Gruyter Ontos, [2013]
Rating:
Werth, Paul W. (Paul William), 1968-
Oxford : Oxford University Press, 2014.
Rating:
Dudley, Will, 1967-
Cambridge ; New York : Cambridge University Press, 2002.
Rating:
Bell, Colleen, 1975-
Vancouver ; Toronto : UBC Press, [2011]
Rating:
Bavetta, Sebastiano, 1964-
New York : Cambridge University Press, 2012.
Rating:
New York : Columbia University Press, [2016]
Rating:
London ; Portland, OR : F. Cass, 2003.
Rating:
New York : Palgrave Macmillan, 2010.
1st ed.
Rating:
Cambridge, Mass. : MIT Press, [2008]
Rating:
Pettit, Philip, 1945-
Cambridge ; New York : Cambridge University Press, 2012.
Rating:
Athens : The University of Georgia Press, [2017]
Rating:
Reichman, Henry, 1947- author.
Baltimore, Maryland : Johns Hopkins University Press, 2021.
Rating:
Bollinger, Lee C., 1946-
Oxford ; New York : Oxford University Press, 2010.
Rating:
Munns, David P. D., 1972- author.
Pittsburgh, Pa. : University of Pittsburgh Press, [2021]
Rating:
VanderVelde, Lea, author.
Oxford ; New York, NY : Oxford University Press, [2014]
Rating:
Tebbe, Nelson, author.
Cambridge, Massachusetts ; London, England : Harvard University Press, 2017.
Rating:
[Place of publication not identified] : Morena Films : Ibits Productions, [2003]
Rating:
Association of College and Research Libraries. National Conference (2015 : Portland, Or.), author.
Chicago : Association of College and Research Libraries, 2015.
Rating:
Kisner, Matthew J., 1974-
Cambridge, UK ; New York : Cambridge University Press, 2011.
Rating:
Lindkvist, Linde, 1985- author.
Cambridge, United Kingdom ; New York, NY : Cambridge University Press, 2017.
Rating:
Powers, Shawn M., 1981-
Urbana : University of Illinois Press, [2015]
Rating:
Powers, Shawn M., 1981-
Urbana : University of Illinois Press, 2015.
Rating:
Shackleton, J. R.
London : London Publishing Partnership, 2021.
Rating:
Bezanson, Randall P.
Urbana [Ill.] : University of Illinois Press, [2012]
Rating:
Madison, Wisconsin : The University of Wisconsin Press, [2019]
Rating:
Neidorf, Robin.
Medford, New Jersey : Information Today, [2012]
Second edition.
Rating:
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