LEADER 00000cam a2200637Ma 4500 
001    ocn646817795 
003    OCoLC 
005    20160711055636.6 
006    m     o  d         
007    cr cn||||||||| 
008    051221s2005    ohua    ob    101 0 eng d 
019    764525342|a778801626 
020    9781615030880|q(electronic book) 
020    1615030883|q(electronic book) 
020    |z087170823X 
020    |z9780871708236 
035    (OCoLC)646817795|z(OCoLC)764525342|z(OCoLC)778801626 
040    E7B|beng|epn|cE7B|dOCLCQ|dN$T|dOCLCQ|dOCLCO|dOCLCF|dOCLCQ
       |dOCLCO|dOCL|dOCLCO|dEBLCP|dDEBSZ|dOCLCO|dOCLCQ|dOCLCO
       |dOCLCQ 
049    RIDW 
050  4 TK7871|b.I63 2005eb 
072  7 TEC|x008010|2bisacsh 
072  7 TEC|x008020|2bisacsh 
082 04 621.3815/48|223 
090    TK7871|b.I63 2005eb 
111 2  International Symposium for Testing and Failure Analysis
       |0https://id.loc.gov/authorities/names/n88088978|n(31st :
       |d2005 :|cSan Jose, Calif.) 
245 10 ISTFA 2005 :|bProceedings of the 31st International 
       Symposium for Testing and Failure Analysis, Movember 6-10,
       2005, McEnery Convention Center, San Jose, California /
       |csponsored by EDFAS--Electronic Device Failure Analysis 
       Society, ISTFA/2005, ASTM International. 
264  1 Materials Park, OH :|bASM International,|c[2005] 
264  4 |c©2005 
300    1 online resource (xviii, 524 pages) :|billustrations 
336    text|btxt|2rdacontent 
337    computer|bc|2rdamedia 
338    online resource|bcr|2rdacarrier 
340    |gpolychrome|2rdacc 
347    text file|2rdaft 
504    Includes bibliographical references and index. 
588 0  Print version record. 
590    eBooks on EBSCOhost|bEBSCO eBook Subscription Academic 
       Collection - North America 
650  0 Electronics|xMaterials|0https://id.loc.gov/authorities/
       subjects/sh85042388|xTesting|0https://id.loc.gov/
       authorities/subjects/sh99005648|vCongresses.|0https://
       id.loc.gov/authorities/subjects/sh99001533 
650  0 Electronic apparatus and appliances|xTesting|vCongresses.
       |0https://id.loc.gov/authorities/subjects/sh2008119292 
650  7 Electronics|xMaterials|xTesting.|2fast|0https://
       id.worldcat.org/fast/907571 
650  7 Electronics|xMaterials.|2fast|0https://id.worldcat.org/
       fast/907562 
650  7 Electronic apparatus and appliances|xTesting|xCongresses.
       |2fast|0https://id.worldcat.org/fast/906839 
655  4 Electronic books. 
655  7 Conference papers and proceedings.|2fast|0https://
       id.worldcat.org/fast/1423772 
655  7 Conference papers and proceedings.|2lcgft|0https://
       id.loc.gov/authorities/genreForms/gf2014026068 
710 2  ASM International.|0https://id.loc.gov/authorities/names/
       n86066562 
710 2  Electronic Device Failure Analysis Society.|0https://
       id.loc.gov/authorities/names/no99092286 
776 08 |iPrint version:|aInternational Symposium for Testing and 
       Failure Analysis (31st : 2005 : San Jose, Calif.).|tISTFA 
       2005.|dMaterials Park, Ohio : ASM International, ©2005
       |z087170823X|w(OCoLC)62723362 
856 40 |uhttps://rider.idm.oclc.org/login?url=http://
       search.ebscohost.com/login.aspx?direct=true&scope=site&
       db=nlebk&AN=395884|zOnline eBook. Access restricted to 
       current Rider University students, faculty, and staff. 
856 42 |3Instructions for reading/downloading this eBook|uhttp://
       guides.rider.edu/ebooks/ebsco 
901    MARCIVE 20231220 
948    |d20161017 |cMH |tebscoebooksacademic updated may-july27
       |lridw 
948    |d20160616|cEBSCO|tebscoebooksacademic|lridw 
994    92|bRID